Test Services
Hua Hong NEC provides in-house IC test solutions and wafer sorting services. The test services include DFT (Design for Testability), new product test evaluation, test development for mass production, and FT (Final Test) development support. Based on those outstanding services, Hua Hong NEC assures customers of a general test solution with higher quality, shorter path for yield ramping up, and more competitive TAT to market.

• Wafer Sorting Service
• Test Development for Mass Production
• Product DFT Solution Support
• IP / Product Test Evaluation

Test Development Services
Hua Hong NEC established its in-house test business in 1999 and has built up an experienced test engineering team to meet various need of testing development. From test platform conversion and test evaluation of new product to mass production test program development, the test engineering team at Hua Hong NEC offers full test services such as planning test flow, setting up platform and developing test program.

• Digital / Mix Signal / SOC Test Development
• Memory / ENVM Test Development
• Contact-less Test Development
• DFT Support Services
• Software and Hardware Development

Wafer Sorting Services
Hua Hong NEC provides in-house wafer sorting services with amount 70K test channels wafer sorting capability within its class 10000 cleaning room. Hua Hong NEC’s test facilities are equipped with the advanced ATEs for testing and evaluating various mixed-signal and digital products. With the most advanced MES (Manufacturing Execution System) -- WITS (Wafer Intelligent Test System), Hua Hong NEC’s wafer sorting system assures the diverse testing recipes with various testing wafers can be loaded automatically and correctly, and test results can be processed rapidly for yield ramping up.

• 70K Test Channels Wafer Probing Capacity
• Multiple Site Test Implementation (up to 128)
• Low/High Temperature Probe (-40°C +150°C)
• Leaser Repair
• Advanced MES / Test Result Analysis System